Cover Image

Stray light and contamination in optical systems : 17-19 August 1988, San Diego, California /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, New Mexico State University. Applied Optics Laboratory, International Technical Symposium on Optical & Optoelectronic Applied Science & Engineering
Other Authors: Breault, Robert P.
Format: Conference Proceeding Book
Language:English
Published: Bellingham, Wash., USA : The Society, [1989]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 967.
Subjects:
Optical instruments > Design and construction > Congresses.
Light > Scattering > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/0967.toc
Description
Item Description:"Part of a two-conference program on optical engineering held at SPIE's 32nd annual International Technical Symposium on Optical & Optoelectronic Applied Science and Engineering, 14-19 August 1988, San Diego"--P. vii.
Physical Description:viii, 334 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0081940025