MARC

Tag First Indicator Second Indicator Subfields
LEADER 00000cam a2200000 a 4500
001 in00000899481
005 20150923191059.0
008 880701s1989 waua b 10100 eng
010 |a  88061839  
020 |a 0892529954 
035 |a (OCoLC)19450746 
035 |9 AEM9681AM 
040 |a DLC  |c DLC  |d TXA  |d UtOrBLW 
049 |a TXAM  |c [A13137986] 
050 0 0 |a TA1650  |b .R43 1989 
082 0 0 |a 670.42  |2 20 
245 0 0 |a Real-time signal processing for industrial applications, 27-28 June, 1988, Dearborn, Michigan /  |c Bahram Javidi, editor ; cosponsored by SPIE, the International Society for Optical Engineering and ESD, the Engineering Society ;cooperating organizations, Applied Optics Laboratory, New Mexico State University [and others]. 
264 1 |a Bellingham, Wash., USA :  |b SPIE Optical Engineering Press,  |c [1989] 
264 4 |c ©1989 
300 |a viii, 254 pages :  |b illustrations ;  |c 28 cm. 
336 |a text  |b txt  |2 rdacontent 
337 |a unmediated  |b n  |2 rdamedia 
338 |a volume  |b nc  |2 rdacarrier 
490 1 |a Critical reviews of optical science and technology 
490 1 |a SPIE ;  |v v. 960 
504 |a Includes bibliographical references and index. 
650 0 |a Optical pattern recognition  |x Industrial applications  |x Congresses. 
650 0 |a Image processing  |x Digital techniques  |x Industrial applications  |x Congresses. 
700 1 |a Javidi, Bahram. 
710 2 |a Society of Photo-optical Instrumentation Engineers. 
710 2 |a Engineering Society of Detroit. 
710 2 |a New Mexico State University.  |b Applied Optics Laboratory. 
830 0 |a Critical reviews of optical science and technology. 
830 0 |a Proceedings of SPIE--the International Society for Optical Engineering ;  |v v. 960. 
999 |a MARS 
999 f f |s c968faf1-8021-3295-a001-6caa2ae1a005  |i 87134897-934b-308d-bc7d-d93fae571d45  |t 0 
952 f f |p ric  |a Texas A&M University  |b Rellis Campus  |c Joint Library Facility  |d Remote Storage  |t 0  |e TA1650 .R43 1989  |h Library of Congress classification  |i unmediated -- volume  |m A14813137986 
998 f f |a TA1650 .R43 1989  |t 0  |l Remote Storage