Testing and diagnosis of VLSI and ULSI /

Bibliographic Details
Corporate Authors: NATO Advanced Study Institute on Testing and Diagnosis of VLSI and ULSI Como, Italy, North Atlantic Treaty Organization. Scientific Affairs Division
Other Authors: Lombardi, Fabrizio, 1955-, Sami, Mariagiovanna
Format: Conference Proceeding Book
Language:English
Published: Dordrecht, Netherlands ; Boston : Kluwer Academic Publishers, [1988]
Series:NATO ASI series. Applied sciences ; no. 151.
Subjects:

MARC

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111 2 |a NATO Advanced Study Institute on Testing and Diagnosis of VLSI and ULSI  |d (1987 :  |c Como, Italy) 
245 1 0 |a Testing and diagnosis of VLSI and ULSI /  |c edited by Fabrizio Lombardi and Mariagiovanna Sami. 
264 1 |a Dordrecht, Netherlands ;  |a Boston :  |b Kluwer Academic Publishers,  |c [1988] 
264 4 |c ©1988 
300 |a viii, 533 pages :  |b illustrations ;  |c 25 cm. 
336 |a text  |b txt  |2 rdacontent 
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490 1 |a NATO ASI series. Series E, Applied sciences ;  |v vol. 151 
500 |a "Proceedings of the NATO Advanced Study Institute on Testing and Diagnosis of VLSI and ULSI, Como, Italy, June 22-July 3, 1987"--Title page verso. 
500 |a "Published in cooperation with NATO Scientific Affairs Division." 
504 |a Includes bibliographies and index. 
650 0 |a Integrated circuits  |x Very large scale integration  |x Testing  |x Congresses. 
700 1 |a Lombardi, Fabrizio,  |d 1955- 
700 1 |a Sami, Mariagiovanna. 
710 2 |a North Atlantic Treaty Organization.  |b Scientific Affairs Division. 
830 0 |a NATO ASI series.  |n Series E,  |p Applied sciences ;  |v no. 151. 
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