Characterization of semiconductor materials : principles and methods /
| Other Authors: | |
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| Format: | Book |
| Language: | English |
| Published: |
Park Ridge, N.J., U.S.A. :
Noyes Publications,
[1989-]
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| Series: | Materials science and process technology series.
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| Subjects: |
| Physical Description: | volumes : illustrations |
|---|---|
| Bibliography: | Includes bibliographical references. |
| ISBN: | 0815512007 (v. 1) : |