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Evaluation of advanced semiconductor materials by electron microscopy /

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Bibliographic Details
Corporate Authors: NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy Bristol, England, North Atlantic Treaty Organization. Scientific Affairs Division, Special Program on Condensed Systems of Low Dimensionality (NATO)
Other Authors: Cherns, David
Format: Conference Proceeding Book
Language:English
Published: New York : Plenum Press, [1989]
Series:NATO ASI series. Physics ; v. 203.
Subjects:
Semiconductors > Surfaces > Congresses.
Electron microscopy > Technique > Congresses.
Electrons > Diffraction > Congresses.
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