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Evaluation of advanced semiconductor materials by electron microscopy /

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Bibliographic Details
Corporate Authors: NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy Bristol, England, North Atlantic Treaty Organization. Scientific Affairs Division, Special Program on Condensed Systems of Low Dimensionality (NATO)
Other Authors: Cherns, David
Format: Conference Proceeding Book
Language:English
Published: New York : Plenum Press, [1989]
Series:NATO ASI series. Physics ; v. 203.
Subjects:
Semiconductors > Surfaces > Congresses.
Electron microscopy > Technique > Congresses.
Electrons > Diffraction > Congresses.
Description
Item Description:"Proceedings of a NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy, held September 12- 17, 1988, in Bristol, United Kingdom"--Verso title page.
"Held within the program of activities of the NATO Special Program on Condensed Systems of Low Dimensionality, running from 1983 to 1988 as part of the activities of the NATO Science Committee"--P. [v].
"Published in cooperation with NATO Scientific Affairs Division."
Physical Description:xi, 412 pages : illustrations
Bibliography:Includes bibliographical references and index.
ISBN:0306433621