Unified methods for VLSI simulation and test generation /
| Main Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Boston :
Kluwer Academic Publishers,
[1989]
|
| Series: | Kluwer international series in engineering and computer science ;
#SECS 73. |
| Subjects: |
| Item Description: | At head of title: AT&T. Includes index. |
|---|---|
| Physical Description: | xii, 148 pages : illustrations ; 24 cm. |
| Bibliography: | Bibliography: pages [113]-143. |
| ISBN: | 0792390253 |