Analytical precision of one-sixth order semiquantitative spectrographic analysis /

Superimposed frequency diagrams represent precision for low, medium, and concentrations of 30 elements routinely determined by Denver-based mobile spectrographic laboratories.

Bibliographic Details
Main Author: Motooka, J. M.
Corporate Author: Geological Survey (U.S.)
Other Authors: Grimes, D. J. (David J.), 1943-
Format: Government Document Book
Language:English
Series:Geological Survey circular ; 738.
Subjects:
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