rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Computer integrated testing
  name:
    name part: Buckroyd, Allen.
  type of resource: text
  genre: bibliography
  origin info:
    place:
      place term: nyu
    date issued: 1989
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: xxii, 394 pages : illustrations ; 23 cm.
  note: edited by Allen Buckroyd.
  note: "A Wiley-Interscience publication."
  note: Includes bibliographies and index.
  subject:
    topic: Computer integrated manufacturing systems
  subject:
    topic: Automatic test equipment
  classification: TS155.6 .C66 1989
  classification: 670.42/7
  identifier: 0471504866
  identifier: 89030990
  record info:
    record content source: DLC
    record creation date: 890209
    record change date: 20151017060546.0
    record identifier: in00000786546