Cover Image

Fifth annual IEEE Semiconductor Thermal and Temperature Measurement Symposium : February 7-9, 1989, Holiday Inn Embarcadero, San Diego, CA, USA.

Bibliographic Details
Corporate Authors: IEEE Semiconductor Thermal and Temperature Measurement Symposium San Diego, Calif., IEEE Components, Hybrids, and Manufacturing Technology Society
Format: Conference Proceeding Book
Language:English
Published: New York, NY : Piscataway, NJ : Institute of Electrical and Electronics Engineers ; Additional copies from IEEE Service Center, [1989]
Subjects:
Semiconductors > Thermal properties > Congresses.
Semiconductors > Cooling > Congresses.
Description
Item Description:Sponsored by the IEEE Components, Hybrids, and Manufacturing Society.
"IEEE catalog number 89CH2688-0."
Cover title: 1989 IEEE Fifth Annual Semiconductor Thermal and Temperature Measurement Symposium.
Spine title: 1989 IEEE Fifth Annual Semiconductor Symposium.
Physical Description:178 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographies.