rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Electronics reliability and measurement technology
    sub title: nondestructive evaluation
  name:
    name part: Heyman, Joseph S.
  name:
    name part: Electronics Reliability and Measurement Technology Workshop (1986 : NASA Langley Research Center)
  type of resource: text
  genre: bibliography
  genre: conference publication
  origin info:
    place:
      place term: nju
    date issued: 1988
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: xii, 128 pages : illustrations
  note: edited by Joseph S. Heyman.
  note: "The Electronics Reliability and Measurement Technology Workshop was held June 3 through 5, 1986 at NASA Langley Research Center"--
  note: Includes bibliographic references.
  subject:
    topic: Integrated circuits
    topic: Testing
    genre: Congresses
  subject:
    topic: Integrated circuits
    topic: Reliability
    genre: Congresses
  subject:
    topic: Nondestructive testing
    genre: Congresses
  classification: TK7874 .E486 1988
  classification: 621.381/028/7
  identifier: 081551171X :
  identifier: 88025395
  record info:
    record content source: DLC
    record creation date: 880808
    record change date: 20231024195254.9
    record identifier: in00000757941