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Electronics reliability and measurement technology : nondestructive evaluation /

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Bibliographic Details
Corporate Author: Electronics Reliability and Measurement Technology Workshop
Other Authors: Heyman, Joseph S.
Format: Conference Proceeding Book
Language:English
Published: Park Ridge, N.J., U.S.A. : Noyes Data Corp., [1988]
Subjects:
Integrated circuits > Testing > Congresses.
Integrated circuits > Reliability > Congresses.
Nondestructive testing > Congresses.
Description
Item Description:"The Electronics Reliability and Measurement Technology Workshop was held June 3 through 5, 1986 at NASA Langley Research Center"--
Physical Description:xii, 128 pages : illustrations
Bibliography:Includes bibliographic references.
ISBN:081551171X :