Electronics Reliability and Measurement Technology Workshop & Heyman, J. S. (1988). Electronics reliability and measurement technology: Nondestructive evaluation. Noyes Data Corp..
Chicago Style (17th ed.) CitationElectronics Reliability and Measurement Technology Workshop and Joseph S. Heyman. Electronics Reliability and Measurement Technology: Nondestructive Evaluation. Park Ridge, N.J., U.S.A.: Noyes Data Corp., 1988.
MLA (9th ed.) CitationElectronics Reliability and Measurement Technology Workshop and Joseph S. Heyman. Electronics Reliability and Measurement Technology: Nondestructive Evaluation. Noyes Data Corp., 1988.
Warning: These citations may not always be 100% accurate.