X-ray calibration : techniques, sources, and detectors /
| Corporate Author: | |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE--the International Society for Optical Engineering,
[1986]
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 689. |
| Subjects: | |
| Online Access: | https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/0689.toc |
| Item Description: | "[Meeting held] 19-20 August 1986, San Diego, California." |
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| Physical Description: | vi, 254 pages : illustrations ; 28 cm. |
| Bibliography: | Includes bibliographies and index. |
| ISBN: | 0892527242 (pbk.) |