X-ray calibration : techniques, sources, and detectors /

Bibliographic Details
Corporate Author: University of Rochester. Institute of Optics
Other Authors: Rockett, Paul D., Lee, Ping
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1986]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 689.
Subjects:
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/0689.toc
Description
Item Description:"[Meeting held] 19-20 August 1986, San Diego, California."
Physical Description:vi, 254 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographies and index.
ISBN:0892527242 (pbk.)