The physics of Si0₂ and its interfaces : proceedings of the International Topical Conference on the Physics of Si0₂ and Its Interfaces, held at the IBM Thomas J. Watson Research Center, Yorktown Heights, New York, March 22-24, 1978 /

Bibliographic Details
Corporate Author: International Topical Conference on the Physics of Si0₂ and Its Interfaces Yorktown Heights, N.Y.
Other Authors: Pantelides, Sokrates T.
Format: Conference Proceeding Book
Language:English
Published: New York : Pergamon Press, [1978]
Subjects:
Description
Physical Description:xi, 488 pages : illustrations ; 27 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0080230490