Cover Image

Stereology and morphometry in electron microscopy : problems and solutions /

Bibliographic Details
Other Authors: Reith, Albrecht, Mayhew, Terry M.
Format: Book
Language:English
Published: New York : Hemisphere Pub. Corp., [1988]
Series:Ultrastructural pathology publication series.
Subjects:
Electron microscopy > Technique.
Stereology.
Description
Item Description:Includes index.
Physical Description:xix, 215 pages : illustrations ; 24 cm.
Bibliography:Bibliography: pages 211-212.
ISBN:0891166238 :
ISSN:0730-6482