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Scanning microscopy technologies and applications : 13-15 January 1988, Los Angeles, California /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, American Society for Precision Engineering, Symposium on Lasers and Optics
Other Authors: Teague, E. C. (Edgar Clayton), 1941-
Format: Conference Proceeding Book
Language:English
Published: Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1988]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 897.
Subjects:
Scanning electron microscopes > Congresses.
Electron microscopy > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/0897.toc

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