Cover Image

Advanced photon and particle techniques for the characterization of defects in solids : symposium held November 27-29, 1984, Boston, Massachusetts, U.S.A. /

Bibliographic Details
Corporate Author: Materials Research Society
Other Authors: Roberto, J. B., Carpenter, R. W., Wittels, M. C.
Format: Book
Language:English
Published: Pittsburgh, Pa. : Materials Research Society, [1985]
Series:Materials Research Society symposia proceedings. v. 41.
Subjects:
Crystals > Defects > Congresses.
Electron microscopy > Congresses.
Proton beams > Congresses.
Particle beams > Congresses.
Description
Physical Description:xi, 390 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographies and indexes.
ISBN:0091837065
ISSN:0272-9172 ;