rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Microscopic identification of electronic defects in semiconductors
    sub title: symposium held April 15-18, 1985, San Francisco, California, U.S.A
  name:
    name part: Johnson, Noble M.
  name:
    name part: Bishop, Stephen G.
  name:
    name part: Watkins, George D.
  name:
    name part: Materials Research Society
  type of resource: text
  genre: bibliography
  genre: conference publication
  origin info:
    place:
      place term: pau
    date issued: 1985
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: xv, 604 pages : illustrations ; 24 cm.
  note: editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins.
  note: Includes bibliographies and indexes.
  subject:
    topic: Semiconductors
    topic: Defects
    genre: Congresses
  subject:
    topic: Microscopes
    topic: Congresses
  subject:
    topic: Microscopy
    topic: Congresses
  classification: TK7871.85 .M53 1985
  classification: 621.3815/2
  related item:
    title info:
      title: Materials Research Society symposia proceedings. v. 46
  identifier: 0931837111 :
  identifier: 85019753
  record info:
    record content source: DLC
    record creation date: 850816
    record change date: 20151016075025.0
    record identifier: in00000736478