http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Microscopic identification of electronic defects in semiconductors
symposium held April 15-18, 1985, San Francisco, California, U.S.A
editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins.
Materials Research Society symposia proceedings. v. 46