Scanning electron microscopy.
| Previous Title: | Scanning Electron Microscope Symposium. Scanning electron microscopy |
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| Corporate Author: | |
| Format: | Serial |
| Language: | English |
| Published: |
AMF O'Hare, IL :
Scanning Electron Microscopy, inc.
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| Subjects: | |
| Online Availability: |
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| Published: | 1978- |
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| Item Description: | "An international review of advances in instrumentation, techniques, theory and physical applications of the scanning electron microscope." |
| Physical Description: | volumes : illustrations ; 29 cm. |
| ISSN: | 0586-5581 |