rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis
    sub title: October 31, 1986, Paris, France
  name:
    name part: IEEE Workshop on Expert Systems and Pattern Analysis (1986 : Paris, France)
    role:
      role term: creator
  name:
    name part: Chen, C. H. (Chi-hau)
    name part: 1937-
  type of resource: text
  genre: bibliography
  genre: conference publication
  origin info:
    place:
      place term: my
    date issued: 1987
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: v, 126 pages : illustrations, portraits ; 26 cm.
  note: edited by C.H. Chen.
  note: Pages also numbered 178-302.
  note: Includes bibliographies.
  subject:
    topic: Expert systems (Computer science)
    genre: Congresses
  subject:
    topic: Pattern recognition systems
    genre: Congresses
  classification: QA76.76.E95 I38 1986
  identifier: 9971504758
  record info:
    record content source: WAU
    record creation date: 880330
    record change date: 20151016074832.0
    record identifier: in00000735448