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Advances in x-ray analysis : proceedings of the ... annual Conference on Application of X-ray Analysis.

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Bibliographic Details
Corporate Authors: Conference on Application of X-ray Analysis, Denver Research Institute
Format: Conference Proceeding
Language:English
Published: New York : Plenum Press, ©1960-©1997.
Subjects:
X-rays > Industrial applications > Congresses.
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Description
Published:Vol. 1-v. 39.
Item Description:Volume 1-volume 39 contains the 6th (Aug. 7-9, 1957)-44th (July 31-Aug. 4, 1995) proceedings of the annual conference.
Subtitle dropped with volume 17.
Physical Description:39 volumes : illustrations ; 26 cm.
Publication Frequency:Annual
ISSN:0376-0308
1097-0002