rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Reliability physics 1980
    sub title: 18th annual proceedings, Las Vegas, Nevada, April 8-10, 1980
  name:
    name part: International Reliability Physics Symposium 1980 : Las Vegas, Nev.)
    role:
      role term: creator
  name:
    name part: IEEE Electron Devices Society
  name:
    name part: IEEE Reliability Society
  type of resource: text
  genre: bibliography
  genre: conference publication
  origin info:
    place:
      place term: nyu
    date issued: 1980
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: vii, 339 pages : illustrations, portraits ; 28 cm.
  note: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
  note: On cover: IEEE 1980 International Reliability Physics.
  note: "IEEE catalog number 80CH1531-3."
  note: Includes bibliographical references.
  subject:
    topic: Semiconductors
    topic: Reliability
    topic: Congresses
  subject:
    topic: Semiconductors
    topic: Testing
    genre: Congresses
  subject:
    topic: Integrated circuits
    topic: Reliability
    genre: Congresses
  subject:
    topic: Integrated circuits
    topic: Testing
    genre: Congresses
  classification: TK7871.85 .I583 1980
  identifier: 79092901
  record info:
    record content source: RRR
    record creation date: 800915
    record change date: 20151016074708.0
    record identifier: in00000734472