X-ray microscopy II : proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 /
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| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Berlin ; New York :
Springer-Verlag,
[1988]
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| Series: | Springer series in optical sciences ;
v. 56. |
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| Item Description: | Based on papers presented at the International Symposium on X-ray Microscopy held at Brookhaven National Laboratory. |
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| Physical Description: | xiv, 454 pages : illustrations |
| Bibliography: | Includes bibliographies and indexes. |
| ISBN: | 0387193928 (U.S.) |