International Symposium on X-ray Microscopy & Sayre, D. (1988). X-ray microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987. Springer-Verlag.
Chicago Style (17th ed.) CitationInternational Symposium on X-ray Microscopy and David Sayre. X-ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987. Berlin ; New York: Springer-Verlag, 1988.
MLA (9th ed.) CitationInternational Symposium on X-ray Microscopy and David Sayre. X-ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987. Springer-Verlag, 1988.
Warning: These citations may not always be 100% accurate.