Automated testing for electronics manufacturing : ATE Seminar/Exhibit, January 23-25, 1979, L. A. Marriott Hotel, Los Angeles, CA : proceedings /

Bibliographic Details
Corporate Author: ATE Seminar/Exhibit Los Angeles
Format: Conference Proceeding Book
Language:English
Published: [Place of publication not identified] : Benwill Pub. Corp., [1979]
Subjects:
Description
Physical Description:128 pages, 42 unnumbered pages : illustrations ; 29 cm.
Bibliography:Bibliography: page 16.