Tutorial : VLS II, the coming revolution in applications and design /

Microelectronic manufacturing yield, reliability, and failure analysis IV : 23-24 September 1998, Santa Clara, California /
Published: (1998)

Process and equipment control in microelectronic manufacturing : 19-20 May 1999, Edinburgh, Scotland /
Published: (1999)

In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing : 19-21 May, 1999, Edinburgh, Scotland /
Published: (1999)

Multichip module technology handbook /
by: Garrou, Philip E.
Published: (1998)

Tutorial : LSI testing /
Published: (1978)

LSI/VLSI testability design /
by: Tsui, Frank F.
Published: (1987)

A one-semester course in modeling of VLSI interconnections /
by: Goel, Ashok K., 1953-
Published: (2015)

Self-testing VLSI design /
by: I͡Armolik, V. N. (Vi͡acheslav Nikolaevich)
Published: (1993)

VLSI test principles and architectures : design for testability /
Published: (2006)

Design & test techniques for VLSI & WSI circuits /
Published: (1989)

Microelectronic materials and processes : [proceedings of the NATO Advanced Study Institute on Microelectronic Materials and Processes, Il Ciocco, Castelvecchio Pascoli, Italy, June 30-July 11, 1986] /
Published: (1989)

From contamination to defects, faults, and yield loss : simulation and applications /
by: Khare, Jitendra B.
Published: (1996)

2001 proceedings : Eighteenth International VLSI Multilevel Interconnection Conference (VMIC), September 25-26, 2001, Santa Clara Marriott Hotel, Santa Clara, CA.
Published: (2001)

Rapid reliability assessment of VLSICs /
Published: (1990)

Digital MOS integrated circuits /
Published: (1981)

Design automation, languages, and simulations /
Published: (2003)

Semi-custom IC design and VLSI /
Published: (1983)

Hierarchical modeling for VLSI circuit testing /
by: Bhattacharya, Debashis, 1961-
Published: (1990)

Characterization and metrology for ULSI technology : 2003 International Conference on Characterization and Metrology for ULSI Technology, Austin, Texas, 24-28 March 2003 /
Published: (2003)

Frontiers of characterization and metrology for nanoelectronics : 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Albany, New York, 11-15 May 2009 /
Published: (2009)

Characterization and metrology for ULSI technology : Richardson, Texas, 15-18 March 2005 /
Published: (2005)

Characterization and metrology for ULSI technology, 2000 : international conference, Gaithersburg, Maryland, 26-29 June 2000 /
Published: (2001)

Diagnostic measurements in LSI/VLSI integrated circuits production /
by: Jakubowski, Andrzej
Published: (1991)

Characterization and metrology for ULSI technology : 1998 international conference, Gaithersburg, Maryland, March 1998 /
Published: (1998)

Large scale integration /
Published: (1976)

Large scale integration : devices, circuits, and systems /
Published: (1981)

Process and equipment control in microelectronic manufacturing II : 30-31 May 2001, Edinburgh, UK /
Published: (2001)

VLSI, technology and design /
Published: (1984)

VLSI technology and design /
Published: (1987)

ULSI technology /
Published: (1996)

VLSI technology : fundamentals and applications /
Published: (1986)

VLSI system design : when and how to design very-large-scale integrated circuits /
by: Muroga, Saburo
Published: (1982)

The design and analysis of VLSI circuits /
by: Glasser, Lance A.
Published: (1985)

Introduction to VLSI design flow /
by: Saurabh, Sneh
Published: (2023)

Genetic algorithms for VLSI design, layout & test automation /
by: Mazumder, Pinaki
Published: (1999)

Very-Large-Scale Integration Physical Design : Engineering Change Order and Timing Design Rule Check.
by: Yeap, Kim Ho
Published: (2025)