2nd European Congress on Optics Applied to Metrology (METROP) : presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France /

Bibliographic Details
Corporate Authors: European Congress on Optics Applied to Metrology Strasbourg, European Photonics Association, Society of Photo-optical Instrumentation Engineers, Optics, Photonics, and Iconics Engineering Meeting
Other Authors: Grosmann, Michel, Meyrueis, Patrick
Format: Conference Proceeding Book
Language:English
Published: Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, [1980]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 210.
Subjects:
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/0210.toc
Description
Physical Description:x, 228 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and indexes.
ISBN:0892522380