EXAFS spectroscopy, techniques and applications /

Bibliographic Details
Corporate Author: Materials Research Society
Other Authors: Teo, B. K., Joy, David C., 1943-
Format: Book
Language:English
Published: New York : Plenum Press, [1981]
Subjects:
Description
Item Description:Based on proceedings of a symposium held at the meeting of the Materials Research Society, Nov. 26-30, 1979, in Boston.
Physical Description:viii, 275 pages : illustrations ; 26 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0306406543