Cover Image

Fourth International Conference [on] Automated Inspection and Product Control, November 7, 8, 9, 1978 /

Bibliographic Details
Corporate Authors: International Conference on Automated Inspection and Product Control Chicago, Ill., American Defense Preparedness Association
Other Authors: McKee, Keith E., Tobin, Henry G.
Format: Conference Proceeding Book
Language:English
Published: [Place of publication not identified] : [publisher not identified], [1978?]
Subjects:
Quality control > Data processing > Congresses.
Engineering inspection > Data processing > Congresses.
Description
Physical Description:xxxv, 327 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references.