Cover Image

Memory, LSI, linear IC : digest of papers /

Bibliographic Details
Corporate Authors: Semiconductor Test Symposium Cherry Hill, N.J., IEEE Computer Society, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: Long Beach, Calif. : IEEE Computer Society Publications Office, [1975]
Subjects:
Semiconductor storage devices > Testing > Congresses.
Minicomputers > Testing > Congresses.
Integrated circuits > Testing > Congresses.
Description
Item Description:"75CH1041-3C."
Physical Description:104 pages : illustrations ; 28 cm.