Cover Image

Pattern recognition and Artificial Intelligence : conference record of the Joint Workshop on Pattern Recognition and Artificial Intelligence, held at Hyannis, Massachusetts, June 1-3, 1976 /

Bibliographic Details
Corporate Authors: Joint Workshop on Pattern Recognition and Artificial Intelligence Hyannis, Mass., IEEE Computer Society
Format: Conference Proceeding Book
Language:English
Published: New York,N.Y. : Institute of Electrical and Electronic Engineers, [1976]
Subjects:
Artificial intelligence > Congresses.
Pattern perception > Congresses.
Description
Item Description:"76CH1169-2 C."
On cover: IEEE 1976 Pattern recognition - Artificial intelligence.
Physical Description:vi, 182 pages : illustrations ; 29 cm.
Bibliography:Includes bibliographical references.