Scanning imaging technology : 2-3 April 1987, The Hague, The Netherlands /

Bibliographic Details
Corporate Authors:	Association nationale de la recherche technique, Society of Photo-optical Instrumentation Engineers
Other Authors:	Wilson, Tony, Balk, Ludwig
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE--The International Society for Optical Engineering, [1987]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 809.
Subjects:	Scanning electron microscopes > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/0809.toc

Description
Item Description:	Conference 809 ... was one of fifteen topical meetings at the Fourth International Symposium on Optical and Optoelectronic Applied Science and Engineering.
Physical Description:	viii, 174 pages : illustrations ; 28 cm.
Bibliography:	Includes bibliographical references and author index.
ISBN:	0892528443 (pbk.)