rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Microlocalization during ion beam analysis
  name:
    name part: Divis, Lynne Marie.
    role:
      role term: creator
  name:
    name part: Burghardt, Robert B.
    role:
      role term: degree committee member.
  name:
    name part: Hart, Ronnie R.
    role:
      role term: degree committee member.
  name:
    name part: Rowe, Marvin W.
    role:
      role term: degree committee member.
  name:
    name part: Schweikert, Emile A.
    role:
      role term: degree supervisor.
  name:
    name part: Texas A & M University
    role:
      role term: degree granting institution.
  type of resource: text
  genre: bibliography
  genre: Academic theses
  origin info:
    place:
      place term: xx
    date issued: 1985
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: xiii, 97 leaves : illustrations (1 folded) ; 29 cm
  abstract: We have investigated three techniques for identifying microregions of the sample examined by an ion beam during analysis. These techniques involve 1) the detection of secondary electrons ejected from the sample during ion bombardment; 2) the detection of light emitted by a phosphor placed behind a thin sample; and 3) the detection of ion tracks in a track recording material placed behind a thin sample. First, we studied the feasibility of obtaining topographic information by detecting bursts of secondary electrons as individual ions strike the sample. The efficiency of detection was sensitive to sample/detector geometry and to detector operation parameters. Under the best operating conditions for our system, a change corresponding to a 95 um sample height difference was detected, and a minimum detectable change corresponding to a 30-40 um sample height difference was estimated. However, we were unable to reproduce the operating conditions under which we obtained these results. Second, we wanted to determine the location where each ion passed through the sample by detecting the ions with a phosphor coupled with a position sensitive detector. Initially, we used a photomultiplier tube (PMT) to detect light from the phosphor. The PMT was sufficiently sensitive both to detect the light emitted upon bombardment of the phosphor by a single ion and to provide a start signal for particle induced desorption time-of-flight mass spectrometry. Next, we attempted to use a silicon-intensified target multichannel detector to detect the light. However, this detector did not demonstrate single ion detection capability. Third, we evaluated two track recording materials for locating where the ions passed through the sample. The polycarbonate track detector recorded the integrated beam spot image, which was revealed with post-analysis etching and SEM observation. The fluorophlogopite track detector recorded tracks which could be observed by TEM without etching. This capability suggests …
  note: "Major subject: Chemistry."
  note: Typescript (photocopy).
  note: Vita.
  note: Ph. D. Texas A & M University 1985
  note: Includes bibliographical references (leaves 93-96).
  subject:
    topic: Ion bombardment
  subject:
    topic: Microscopes
  subject:
    topic: Microscopy
  subject:
    topic: Major chemistry
  identifier: http://proxy.library.tamu.edu/login
  identifier: https://hdl.handle.net/1969.1/DISSERTATIONS-594468
  related item:
    location:
      url: http://proxy.library.tamu.edu/login
  related item:
    location:
      url: https://hdl.handle.net/1969.1/DISSERTATIONS-594468
  record info:
    record content source: TXA
    record creation date: 870725
    record change date: 20220103135323.0
    record identifier: in00000587914
    language of cataloging:
      language term: eng