Properties of amorphous silicon.

Bibliographic Details
Corporate Author: INSPEC (Information service)
Format: Book
Language:English
Published: London ; New York : INSPEC, Institution of Electrical Engineers, [1985]
Series:EMIS datareviews series ; no. 1.
Subjects:
Description
Physical Description:1 volume (various pagings) ; 29 cm.
Bibliography:Includes bibliographical references.
ISBN:0852963041