rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: In-circuit testing
  name:
    name part: Bateson, John.
    role:
      role term: creator
  type of resource: text
  genre: bibliography
  origin info:
    place:
      place term: nyu
    date issued: 1985
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: xvii, 243 pages : illustrations ; 24 cm.
  note: John Bateson.
  note: Includes index.
  note: Bibliography: page 219.
  subject:
    topic: Printed circuits
    topic: Testing
  classification: TK7868.P7 B37 1985
  classification: 621.381/74/0287
  identifier: 0442212844
  identifier: 84027128
  record info:
    record content source: DLC
    record creation date: 841206
    record change date: 20151014055912.0
    record identifier: in00000574061