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In-circuit testing /

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Bibliographic Details
Main Author: Bateson, John
Format: Book
Language:English
Published: New York : Van Nostrand Reinhold, [1985]
Subjects:
Printed circuits > Testing.
Description
Item Description:Includes index.
Physical Description:xvii, 243 pages : illustrations ; 24 cm.
Bibliography:Bibliography: page 219.
ISBN:0442212844