Fine line lithography /

Sub-half-micron lithography for ULSIs /
Published: (2000)

LSI/VLSI testability design /
by: Tsui, Frank F.
Published: (1987)

Handbook of VLSI microlithography : principles, technology, and applications /
Published: (1991)

Handbook of VLSI microlithography : principles, technology, and applications /
Published: (2001)

Methods and materials in microelectronic technology /
Published: (1984)

Digital MOS integrated circuits /
Published: (1981)

2001 proceedings : Eighteenth International VLSI Multilevel Interconnection Conference (VMIC), September 25-26, 2001, Santa Clara Marriott Hotel, Santa Clara, CA.
Published: (2001)

Rapid reliability assessment of VLSICs /
Published: (1990)

VLSI test principles and architectures : design for testability /
Published: (2006)

Self-testing VLSI design /
by: I͡Armolik, V. N. (Vi͡acheslav Nikolaevich)
Published: (1993)

Design & test techniques for VLSI & WSI circuits /
Published: (1989)

Hierarchical modeling for VLSI circuit testing /
by: Bhattacharya, Debashis, 1961-
Published: (1990)

Frontiers of characterization and metrology for nanoelectronics : 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Albany, New York, 11-15 May 2009 /
Published: (2009)

Characterization and metrology for ULSI technology, 2000 : international conference, Gaithersburg, Maryland, 26-29 June 2000 /
Published: (2001)

Characterization and metrology for ULSI technology : 2003 International Conference on Characterization and Metrology for ULSI Technology, Austin, Texas, 24-28 March 2003 /
Published: (2003)

Diagnostic measurements in LSI/VLSI integrated circuits production /
by: Jakubowski, Andrzej
Published: (1991)

Characterization and metrology for ULSI technology : Richardson, Texas, 15-18 March 2005 /
Published: (2005)

Characterization and metrology for ULSI technology : 1998 international conference, Gaithersburg, Maryland, March 1998 /
Published: (1998)

From contamination to defects, faults, and yield loss : simulation and applications /
by: Khare, Jitendra B.
Published: (1996)

Large scale integration /
Published: (1976)

Large scale integration : devices, circuits, and systems /
Published: (1981)

ULSI technology /
Published: (1996)

VLSI planarization : methods, models, implementation /
by: Feinberg, V.
Published: (1997)

The bounding approach to VLSI circuit simulation /
by: Zukowski, Charles A.
Published: (1986)

Mixed analog-digital VLSI devices and technology : an introduction /
by: Tsividis, Yannis
Published: (1996)

VLSI electronics : microstructure science, volume 7 /
Published: (1983)

Design automation, languages, and simulations /
Published: (2003)

Unified methods for VLSI simulation and test generation /
by: Cheng, Kwang-Ting, 1961-
Published: (1989)

Genetic algorithms for VLSI design, layout & test automation /
by: Mazumder, Pinaki
Published: (1999)

Power-constrained testing of VLSI circuits /
by: Nicolici, Nicola
Published: (2003)

Power-constrained testing of VLSI circuits /
by: Nicolici, Nicola
Published: (2003)

Top-down digital VLSI design : from architectures to gate-level circuits and FPGAs /
by: Kaeslin, Hubert
Published: (2014)

1997 proceedings : Second Annual IEEE International Conference on Innovative Systems in Silicon, Austin, Texas, USA /
Published: (1997)

Tutorial : VLS II, the coming revolution in applications and design /
Published: (1980)

VLSI technology and design /
Published: (1987)

The VLSI handbook /
Published: (2000)