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Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 /

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Bibliographic Details
Corporate Authors: International Conference on Secondary Ion Mass Spectrometry Osaka, Japan, Nihon Gakujutsu Shinkōkai
Other Authors: Benninghoven, A.
Format: Conference Proceeding Book
Language:English
Published: Berlin ; New York : Springer-Verlag, 1984.
Series:Springer series in chemical physics ; v. 36.
Subjects:
Secondary ion mass spectrometry > Congresses.
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