http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983
International Conference on Secondary Ion Mass Spectrometry 1983 : Osaka, Japan)
xv, 503 pages : illustrations (some color) ; 24 cm.
Springer series in chemical physics ; v. 36