Secondary ion mass spectrometry : SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983 /
| Corporate Authors: | , |
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| Other Authors: | |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Berlin ; New York :
Springer-Verlag,
1984.
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| Series: | Springer series in chemical physics ;
v. 36. |
| Subjects: |
| Physical Description: | xv, 503 pages : illustrations (some color) ; 24 cm. |
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| Bibliography: | Includes bibliographies and index. |
| ISBN: | 038713316X (U.S.) |