X-ray microscopy : proceedings of the international symposium, Gottingen, Fed. Rep. of Germany, September 14-16, 1983 /
| Other Authors: | , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Berlin ; New York :
Springer-Verlag,
1984.
|
| Series: | Springer series in optical sciences ;
v. 43. |
| Subjects: |
| Physical Description: | ix, 345 pages : illustrations (some color) ; 24 cm. |
|---|---|
| Bibliography: | Includes bibliographical references. |
| ISBN: | 0387132716 (U.S.) |