Trace analysis and technological development : special and contributed papers presented at an international symposium held at Bhabha Atomic Research Centre, Bombay (February 16-19, 1981) /

Bibliographic Details
Corporate Authors:	International Union of Pure and Applied Chemistry, International Symposium on Trace Analysis and Technological Development
Other Authors:	Das, M. Sankar
Format:	Conference Proceeding Book
Language:	English
Published:	New York : Wiley, [1983]
Subjects:	Trace elements > Analysis.

Description
Item Description:	Co-sponsored by International Union of Pure and Applied Chemistry. "Presented at the First International Symposium on Trace Analysis and Technological Development"--Pref. "A Halsted Press book."
Physical Description:	x, 407 pages : illustrations ; 26 cm.
Bibliography:	Includes bibliographical references.
ISBN:	047027462X