Transmission electron microscopy : physics of image formation and microanalysis /
| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
Berlin ; New York :
Springer-Verlag,
1984.
|
| Series: | Springer series in optical sciences ;
v. 36. |
| Subjects: |
| Physical Description: | xii, 521 pages : illustrations ; 24 cm. |
|---|---|
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0387117946 (U.S.) |