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New horizons in testing : latent trait test theory and computerized adaptive testing /

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Bibliographic Details
Corporate Authors: United States. Office of Naval Research, Computerized Adaptive Testing Conference
Other Authors: Weiss, David J., Bock, R. Darrell
Format: Conference Proceeding Book
Language:English
Published: New York : Academic Press, 1983.
Subjects:
Psychological tests > Congresses.
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Published 1983
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