Cover Image

1983 IEEE ATPG Workshop proceedings : March 15-16, 1983, San Francisco, California.

Bibliographic Details
Corporate Authors: Automatic Test Program Generation Workshop San Francisco, Calif., Institute of Electrical and Electronics Engineers
Format: Conference Proceeding Book
Language:English
Published: Silver Spring, MD : IEEE Computer Society Press, [1983]
Subjects:
Automatic test equipment > Congresses.
Description
Item Description:At head of title: Automatic Test Program Generation Workshop.
"IEEE catalog number 83CH1878-8."
"IEEE Computer Society order number 461."
Spine title: IEEE 1983 3rd Automatic Test Program Generation (ATPG) Workshop.
Physical Description:ix, 133 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0818604611 (pbk.)
0818684615 (hard)
0818644613 (microfiche)