Cover Image

Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983 /

Bibliographic Details
Corporate Authors: International Test Conference Philadelphia, Pa., IEEE Computer Society. Test Technology Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: Silver Spring, MD : IEEE Computer Society Press, 1983.
Subjects:
Integrated circuits > Testing > Congresses.
Electronic digital computers > Circuits > Testing > Congresses.
Automatic test equipment > Congresses.
Équipement d'essai automatique > Congrès.
Automatic test equipment.
Electronic digital computers > Circuits > Testing.
Integrated circuits > Testing.
Conference papers and proceedings.
Description
Item Description:Spine title: International Test Conference 1983 proceedings.
"IEEE catalog no. 83CH1933-1."
"Computer Society order no. 502."
Physical Description:xxv, 806 pages : illustrations ; 28 cm
Bibliography:Includes bibliographical references and index.
ISBN:0818605022
9780818605024