Applications of optical metrology--techniques and measurements II : [proceedings] April 7-8, 1983, Arlington, Virginia /
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash. :
SPIE--International Society for Optical Engineering,
[1983]
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 416. |
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| Physical Description: | vi, 214 pages : illustrations ; 28 cm. |
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| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0892524510 (pbk.) |