Patel, K. C. (1976). A study of the combined influence of temperature and material defects on semiconductor device performance. Patel.
Chicago Style (17th ed.) CitationPatel, Kanaiyalal Chaturbhai. A Study of the Combined Influence of Temperature and Material Defects on Semiconductor Device Performance. [College Station, Tex.]: Patel, 1976.
MLA (9th ed.) CitationPatel, Kanaiyalal Chaturbhai. A Study of the Combined Influence of Temperature and Material Defects on Semiconductor Device Performance. Patel, 1976.
Warning: These citations may not always be 100% accurate.