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Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE.

Bibliographic Details
Corporate Authors: Semiconductor Test Symposium Cherry Hill, N.J., IEEE Computer Society, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: New York : Long Beach, Calif. : Institute of Electrical and Electronics Engineers ; Available from IEEE Computer Society Publications Office, [1974]
Subjects:
Integrated circuits > Testing > Congresses.
Semiconductor storage devices > Testing > Congresses.
Integrated circuits > Large scale integration > Congresses.
Description
Item Description:"74CH0909-2C."
Physical Description:261 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references.